Design of an Error Detection and Data Recovery Architecture for Motion Estimation Testing Applications
Authors:MATCHA VENKATA RATNAM, M. BIGHNESWAR, ADITYA P
Keywords: Motion Estimation; Data Recovery; Xilinx; Residue Quotient.
Authors:MATCHA VENKATA RATNAM, M. BIGHNESWAR, ADITYA P
Abstract: This paper presents an error detection and data recovery (EDDR) design, based on the residue-and-quotient (RQ)
code, to embed into motion estimation (ME) for video coding testing applications. An error in processing elements (PEs), i.e.
key components of a ME, can be detected and recovered effectively by using the EDDR design. The proposed EDDR design
for ME testing can detect errors and recover data with an acceptable area overhead and timing penalty. The functional
verification and synthesis can be done by Xilinx ISE. That is when compare to the existing design the implemented design area
and timing will be reduced.
Keywords: Motion Estimation; Data Recovery; Xilinx; Residue Quotient.
INTRODUCTION
The new Joint Video Team (JVT) video coding standard
has garnered increased attention recently. Generally, motion
estimation computing array (MECA) performs up to 50% of
computations in the entire video coding system, and is
typically considered the computationally most important
part of video coding systems. Thus, integrating the MECA
into a system-on-chip(SOC) design has become increasingly
important for video coding applications. Although advances
in VLSI technology allow integration of a large number of
processing elements (PEs) in an MECA into an SOC, this
increases the logic-per-pin ratio, thereby significantly
decreasing the efficiency of chip logic testing. For a
commercial chip, a video coding system must introduce
design for testability (DFT), especially in an MECA. The
objective of DFT is to increase the ease with which a device
can be tested to guarantee high system reliability. Many
DFT approaches have been developed. These approaches
can be divided into three categories: ad hoc (problem
oriented), structured, and built-in self-test (BIST). Among
these techniques, BIST has an obvious advantage in that
expensive test equipment is not needed and tests are low
cost.
No comments:
Post a Comment