Design of an Error Detection and Data Recovery Architecture for Motion Estimation Testing Applications

Design of an Error Detection and Data Recovery Architecture for Motion Estimation Testing Applications
Authors:MATCHA VENKATA RATNAM, M. BIGHNESWAR, ADITYA P

Abstract: This paper presents an error detection and data recovery (EDDR) design, based on the residue-and-quotient (RQ) code, to embed into motion estimation (ME) for video coding testing applications. An error in processing elements (PEs), i.e. key components of a ME, can be detected and recovered effectively by using the EDDR design. The proposed EDDR design for ME testing can detect errors and recover data with an acceptable area overhead and timing penalty. The functional verification and synthesis can be done by Xilinx ISE. That is when compare to the existing design the implemented design area and timing will be reduced.

Keywords: Motion Estimation; Data Recovery; Xilinx; Residue Quotient.

INTRODUCTION 

           The new Joint Video Team (JVT) video coding standard has garnered increased attention recently. Generally, motion estimation computing array (MECA) performs up to 50% of computations in the entire video coding system, and is typically considered the computationally most important part of video coding systems. Thus, integrating the MECA into a system-on-chip(SOC) design has become increasingly important for video coding applications. Although advances in VLSI technology allow integration of a large number of processing elements (PEs) in an MECA into an SOC, this increases the logic-per-pin ratio, thereby significantly decreasing the efficiency of chip logic testing. For a commercial chip, a video coding system must introduce design for testability (DFT), especially in an MECA. The objective of DFT is to increase the ease with which a device can be tested to guarantee high system reliability. Many DFT approaches have been developed. These approaches can be divided into three categories: ad hoc (problem oriented), structured, and built-in self-test (BIST). Among these techniques, BIST has an obvious advantage in that expensive test equipment is not needed and tests are low cost. 

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